Study on Threshold Voltage Control of Tunnel Field-Effect Transistors Using VT-Control Doping Region

نویسندگان

  • Hyungjin Kim
  • Min-Chul Sun
  • Hyun Woo Kim
  • Sang Wan Kim
  • Garam Kim
  • Byung-Gook Park
چکیده

Although the Tunnel Field-Effect Transistor (TFET) is a promising device for ultra-low power CMOS technology due to the ability to reduce power supply voltage and very small off-current, there have been few reports on the control of VT for TFETs. Unfortunately, the TFET needs a different technique to adjust VT than the MOSFET because most of TFETs are assumed to use on SOI substrates. In this paper, we propose a technique to control VT of the TFET by putting an additional VT-control doping region (VCR) between source and channel. We examine how much VT is changed by doping concentration. An increase of n-type doping concentration reduces VT because it increases the semiconductor work function difference, φs,channel φs,source, at off-state. Also, the effect of the size of the region is investigated. The region can be confined at the top of silicon surface because most of tunneling occurs at the surface. At the same time, we study the optimum width of this region while considering the mobility degradation by doping. Keyword Tunnel Field-Effect Transistor threshold voltage VT-control doping region (VCR)

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عنوان ژورنال:
  • IEICE Transactions

دوره 95-C  شماره 

صفحات  -

تاریخ انتشار 2012